Concepedia

X-ray characterization of stresses and defects in thin films and substrates

G. A. Rozgonyi, David Miller

Thin Solid Films · 1976 · 50 citations · 31 references

DOI

Concepts

References

31

The optical principles of the diffraction of x-rays

H. Steinfink · Geochimica et Cosmochimica Acta · 1966 · 714 citations

, , +11

Precision lattice constant determination

W. L. Bond · Acta Crystallographica · 1960 · 703 citations · Full text

, , +11

The projection topograph: a new method in X-ray diffraction microradiography

A. R. Lang · Acta Crystallographica · 1959 · 503 citations

, , +4

Calculation of stress in electrodeposits from the curvature of a plated strip

Abner Brenner, S. Senderoff · Journal of research of the National Bureau of Standards · 1949 · 406 citations · Full text

, , +13

Measurement of Strains at Si-SiO2 Interface

R. J. Jaccodine, William A. Schlegel · Journal of Applied Physics · 1966 · 403 citations

, , +17