The influence of solder volume and pad area on Sn–3.8Ag–0.7Cu and Ni UBM reaction in reflow soldering and isothermal aging

C.K. Wong, J.H.L. Pang, J.W.R. Tew, B. K. Lok, Haoran Lu, Fern Lan Ng, Yukai Sun

Microelectronics Reliability · 2007 · 32 citations · 20 references

Concepts

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