IEEE Software · 1996 · 376 citations · 8 references
Test Plan DevelopmentEngineeringTest CoverageTest Data GenerationSoftware EngineeringSoftware AnalysisAutomatic Test GenerationCombinatorial Design MethodFault Detection AbilityCombinatorial OptimizationTest GenerationDesignComputer EngineeringComputer ScienceSoftware DesignProgram AnalysisSoftware TestingFormal MethodsTest Case DesignCombinatorial Testing WorkflowTest Evolution
The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.
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Effect of test set minimization on fault detection effectiveness
W. Eric Wong, J.R. Horgan, Saul London et al. · 1995 · 203 citations
Engineering, Fault Detection Effectiveness, Verification +18
The Automatic Efficient Test Generator (AETG) system
David Cohen, Siddhartha R. Dalal, A. Kajla et al. · 2002 · 112 citations