Applied Surface Science · 2005 · 31 citations · 5 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsCrystallization AnalysisCrystallization ProcessesCurie TemperatureSemiconductor Crystal GrowthSemiconductor Device MaterialsX-ray DiffractionChalcogenide Thin FilmsCrystallizationCrystallization BehaviorCrystallization ControlHeat Treatment EffectsIn Situ X-ray DiffractionThin-film CrystallizationX-ray Diffraction Analysis
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Naohiko Kato, Yasuhiko Takeda, Tatsuo Fukano et al. · Japanese Journal of Applied Physics · 1999 · 18 citations
Natural Sciences, Materials Engineering, Materials Science +17