Publication | Closed Access
Thermomigration of Cu–Sn and Ni–Sn intermetallic compounds during electromigration in Pb-free SnAg solder joints
48
Citations
27
References
2011
Year
Materials ScienceMaterials EngineeringElectrical EngineeringNi–sn Intermetallic CompoundsEngineeringElectromigration TechniqueApplied PhysicsMetallurgical InteractionElectronic Packaging
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