Publication | Closed Access
Refractive indices of ir materials: 106-μm ellipsometer measurements
23
Citations
8
References
1977
Year
Optical MaterialsEngineeringOptical GlassOptical TestingChemistryMicro-optical ComponentOptical CharacterizationSpectroscopic Property10.6-Microm Ellipsometric MeasurementsOptical PropertiesInfrared OpticOptical SpectroscopyZnse CrystalsModulated Light EllipsometerOrganic PhotonicsInfrared SensorApplied PhysicsIr MaterialsOptoelectronics
10.6-microm ellipsometric measurements, using a modulated light ellipsometer, are reported for the refractive imdies of KCL, CdTe, and ZnSe crystals and for ZnSe and ThF(4) films.
| Year | Citations | |
|---|---|---|
Page 1
Page 1