Structures at the Xe 5s threshold studied by photon-induced fluorescence spectroscopy

Abstract

The photoionisation of Xe has been studied by photon-induced fluorescence spectroscopy (PIFS) for photon energies between 23 and 26.5 eV. The fluorescence radiation was dispersed and recorded between 103.5 and 112 nm. A prominent peak structure of the Xe 5s photoionisation cross section was observed and was attributed to two-electron excitations in neutral Xe which strongly contribute to the ionisation process.