Publication | Open Access
Photoamperic probes in scanning tunneling microscopy
29
Citations
8
References
1994
Year
Semiconductor TipPhotoamperic ProbesEngineeringTunneling MicroscopyPhysicsMicroscopyNanoelectronicsMicroscopy MethodScanning Probe MicroscopyApplied PhysicsPhotoelectric MeasurementLaser IrradiationIncident Optical PowerMedicineOptoelectronicsBiophysicsElectro-optics Device
The charge generated at the apex of a semiconductor tip upon laser irradiation is utilized in a scanning tunneling microscope. We show such arrangements can produce photoinduced tunnel currents of several hundred picoamperes, sufficient for stable STM operation and sensitive enough to detect nanowatt variations in the incident optical power.
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