Femtosecond x-ray absorption spectroscopy with hard x-ray free electron laser

Tetsuo Katayama, Yuichi Inubushi, Yuki Obara, Takahiro Sato, Tadashi Togashi, Kensuke Tono, Takaki Hatsui, Takashi Kameshima, Atanu Bhattacharya, Yoshihiro Ogi,

Applied Physics Letters · 2013 · 74 citations · 33 references

Concepts

Abstract

We have developed a method of dispersive x-ray absorption spectroscopy with a hard x-ray free electron laser (XFEL), generated by a self-amplified spontaneous emission (SASE) mechanism. A transmission grating was utilized for splitting SASE-XFEL light, which has a relatively large bandwidth (ΔE/E ∼ 5 × 10−3), into several branches. Two primary split beams were introduced into a dispersive spectrometer for measuring signal and reference spectra simultaneously. After normalization, we obtained a Zn K-edge absorption spectrum with a photon-energy range of 210 eV, which is in excellent agreement with that measured by a conventional wavelength-scanning method. From the analysis of the difference spectra, the noise ratio was evaluated to be ∼3 × 10−3, which is sufficiently small to trace minute changes in transient spectra induced by an ultrafast optical laser. This scheme enables us to perform single-shot, high-accuracy x-ray absorption spectroscopy with femtosecond time resolution.

References

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