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Temperature dependence of the radiative recombination zone in InGaN/GaN multiple quantum well light-emitting diodes
43
Citations
12
References
2001
Year
Wide-bandgap SemiconductorEngineeringTemperature DependenceGan FilmsNanoelectronicsLight-emitting DiodesCompound SemiconductorPhotonicsElectrical EngineeringPhotoluminescencePhysicsAluminum Gallium NitrideRadiative Recombination ZoneMicroelectronicsCategoryiii-v SemiconductorSolid-state LightingApplied PhysicsGan Power DeviceActivation EnergyOptoelectronics
The temperature dependence of the radiative recombination zone in InGaN/GaN multiple quantum well light-emitting diodes is investigated. From the electroluminescence spectra measured at various temperatures, it is found that there are two peaks at about 400 and 460 nm, which can be assigned as Mg-related and quantum well transitions, respectively. The behavior of these two peaks with temperature is modeled by the two rate equation. Based on this model, we deduce the activation energy of Mg in GaN films to be about 126 meV, which is consistent with reported results obtained by other techniques.
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