Optics Express · 2010 · 144 citations · 13 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsLaser DiodesQuantum WellsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor LasersSemiconductor PhysicsBand AlignmentBand GapCarrier LifetimeDirect Band GapOptical ConfinementQuantum Well Laser DiodesQuantum Well StructuresType-i Quantum Wells
This paper presents modeling and simulation of a silicon-based group IV semiconductor injection laser diode in which the active region has a multiple quantum well structure formed with Ge(0.9)Sn(0.1) quantum wells separated by Ge(0.75)Si(0.1)Sn(0.15) barriers. These alloy compositions were chosen to satisfy three conditions simultaneously: a direct band gap for Ge(0.9)Sn(0.1), type-I band alignment between Ge(0.9)Sn(0.1) and Ge(0.75)Si(0.1)Sn(0.15,) and a lattice match between wells and barriers. This match ensures that the entire structure can be grown strain free upon a relaxed Ge(0.75)Si(0.1)Sn(0.15) buffer on a silicon substrate - a CMOS compatible process. Detailed analysis is performed for the type I band offsets, carrier lifetime, optical confinement, and modal gain. The carrier lifetime is found to be dominated by the spontaneous radiative process rather than the Auger process. The modal gain has a rather sensitive dependence on the number of quantum wells in the active region. The proposed laser is predicted to operate at 2.3 μm in the mid infrared at room temperature.
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Near-band-gap photoluminescence of Si-Ge alloys
J. Weber, M. I. Alonso · Physical review. B, Condensed matter · 1989 · 561 citations
Predicted band gap of the new semiconductor SiGeSn
Richard Soref, C. H. Perry · Journal of Applied Physics · 1991 · 160 citations