The Computation of Dielectric Constants

Abstract

We consider the shorted-line method as applied to general samples, not restricted to quarter-wave, half-wave, thin, or low loss. The complex dielectric constant can be obtained by combination of two measurements, the sample being followed by short and open circuit, respectively. The equation is simple, nontranscendental, and unambiguous (Eqs. (5), (11), (19), (22)). It lends itself to complete graphical representation (Table I, Fig. 2). When only a single measurement is made, as in conventional practice, a change of variable leads to great simplification of detail ((14), (15), (16), Figs. 2, 3, 4). With due regard to the nature and magnitude of experimental errors, we analyze the conditions for optimum graphical representation, and give a reasoned determination of scale ranges. Large scale curves have been constructed, but only reductions are given here.