Publication | Open Access
High-resolution hard-X-ray fluorescence spectrometer
12
Citations
11
References
2009
Year
X-ray SpectroscopyEngineeringMicroscopyGermanium CrystalX-ray FluorescenceX10da-superxas BeamlineInstrumentationBiophysicsSwiss Light SourcePhysicsSynchrotron RadiationX-ray Free-electron LaserCrystallographyFluorescence MicroscopySpectroscopyX-ray DiffractionApplied PhysicsMedicineX-ray Optic
A Johann-type X-ray fluorescence spectrometer for XES, RXES/RIXS, HERFD XAS and RXS experiments was designed, constructed and commissioned at the X10DA-SuperXAS beamline of the Swiss Light Source. The spectrometer consists of three key elements: a sample manipulator, an X-ray dispersive element (spherically bent silicon or germanium crystal), and an one-dimensional-array X-ray detector. The detected X-ray fluorescence energy is scanned by changing the angle between the sample, crystal and detector. The energy resolution of the spectrometer ranges from sub-eV to several eV. Thanks to the use of a one-dimensional array detector the spectrometer is easy to align and operate.
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