Local conductance measurement of graphene layer using conductive atomic force microscopy

Abstract

This paper reports the local conductivity mapping of graphene films prepared by chemical vapor deposition and mechanical exfoliation with the help of atomic force microscope where a conducting tip scanned the graphene surface with bias voltage. The surface morphology measured by field emission scanning electron microscopy confirmed that domains and wrinkles were formed on graphene samples grown by chemical vapor deposition, and the difference in the amount of current is observed on these domain boundaries and wrinkles. The percolation current path observed in current map explains that graphene grown by the chemical vapor deposition has low conductivity compared with one mechanically exfoliated. On the other hand, exfoliated graphene layer showed sign of conductivity differences on step edges and wrinkles in comparison to flat region. The resulting observations can be explained with the help of existing theories regarding graphene and by considering the effect of sample preparation conditions.