Journal of Scientific Instruments · 1960 · 21 citations · 4 references
Natural SciencesMaterials SciencePhysicsMaterials CharacterizationSemiconductor MaterialsSolid State PhysicsHeat Transfer In SolidsTemperature MeasurementThermal DiffusivityThermal Properties Of MaterialsThermal Properties Of SemiconductorsThermoelectric MaterialsSingle-crystal CrystallographyTemperature-dependent Thermal DiffusivityThermal Conductivity MeasurementsThermal Diffusivity EstimationThermal Diffusivity MeasurementThermal Diffusivity Of SolidsThermoelectric PropertiesThermoelectric Transport Coefficients
An apparatus for the accurate determination of the thermal diffusivity of semiconductors, which utilizes the thermoelectric properties of such materials, is described. In its present form, the apparatus can be used between room temperatures and 180° C. The application of the method is illustrated by an experiment using a single-crystal specimen of bismuth telluride.
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