Decision of error tolerance in array element by the Monte Carlo method

Abstract

In this paper, the tolerance of errors in each array element that is required to satisfy the tolerance of beam pattern is decided by the Monte Carlo (MC) method. To examine the pass or fail of element errors to the desired beam pattern, instead of exploring the whole M-segmented element error as is usually done in deterministic methods, MC tests only for randomly selected errors and greatly reduce the computational costs with the desired numerical accuracy. The different effect of each element error on the resultant beam pattern is considered by calculating the variance of error for each element, the tolerance of an element is decided when 95% of N samples meet the acceptable beam pattern. To verify the proposed technique, the tolerance of each element in two-dimensional planar array is determined.