Scanner identification with extension to forgery detection

Nitin Khanna, George T.‐C. Chiu, Jan P. Allebach, Edward J. Delp

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2008 · 24 citations · 19 references

Concepts

Abstract

Digital images can be obtained through a variety of sources including digital cameras and scanners. With rapidly increasing functionality and ease of use of image editing software, determining authenticity and identifying forged regions, if any, is becoming crucial for many applications. This paper presents methods for authenticating and identifying forged regions in images that have been acquired using flatbed scanners. The methods are based on using statistical features of imaging sensor pattern noise as a fingerprint for the scanner. An anisotropic local polynomial estimator is used for obtaining the noise patterns. A SVM classifier is trained for using statistical features of pattern noise for classifying smaller blocks of an image. This feature vector based approach is shown to identify the forged regions with high accuracy.

References

19