Sensor Pattern Noise Analysis is a digital image forensic technique that identifies unique noise patterns inherent to individual imaging sensors, distinguishing it from other source attribution methods by leveraging the consistent spatial noise signatures generated during image acquisition to verify the authenticity and origin of digital media.
40
Publications
2.4K
Citations
92
Authors
41
Institutions
Publications per year
2017–2026
16
Parents
Publications
40
1–5 of 40
Authors
92
- CL
7
h-index
- JF
3
h-index
- MG
3
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- AR
2
h-index
- ML
2
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1–5 of 92
Institutions
41
University of Warwick
Coventry, United Kingdom
7 h-index
10 publications
622 citations
Binghamton University
Binghamton, United States
3 h-index
9 publications
1.7K citations
University of Florence
Florence, Italy
3 h-index
9 publications
455 citations
Hunan University
Changsha, China
2 h-index
3 publications
147 citations
Indian Institute of Information Technology Design and Manufacturing Jabalpur
Jabalpur, India
2 h-index
4 publications
90 citations
Changsha University of Science and Technology
Changsha, China
2 h-index
2 publications
84 citations
Universidad Complutense de Madrid
Madrid, Spain
2 h-index
6 publications
120 citations
University of Cagliari
Cagliari, Italy
2 h-index
3 publications
40 citations
1–8 of 41
Venues
- Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
4 publications · 615 citations
4
h-index
- IEEE Transactions on Information Forensics and Security
4 publications · 460 citations
4
h-index
- IET Computer Vision
1 publications · 20 citations
2
h-index
- Sensors
2 publications · 72 citations
2
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- IEEE Access
2 publications · 78 citations
2
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1–5