Applied Physics Letters · 2001 · 27 citations · 14 references
Natural SciencesMaterials ScienceElectrochemistryNanomaterialsNanotechnologyLight MicroscopyScanning Probe MicroscopySurface MicroscopyElectrolytic DepositionHigh-resolution ImagingMicroscopyMicroscopy ImagingNear-field Optical MicroscopyNear-field OpticsNear-field Scanning Optical MicroscopyScanning Near-field Optical Microscopy
Aperture probes for near-field optical microscopy were produced by controlled all solid state electrolysis. Control of both the ionic current and light transmission provided reproducible probe tips with aperture diameters in the sub-50 nm range and flat end faces. High resolution scanning near-field optical microscopy images were obtained with these probes. As a by-product, the formation of an electrolytic nanometer-sized contact was observed.
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Near-field optical-scanning microscopy
U. Dürig, Dieter Pohl, F. Röhner · Journal of Applied Physics · 1986 · 727 citations
Facts and artifacts in near-field optical microscopy
Bert Hecht, H. Bielefeldt, Yasushi Inouye et al. · Journal of Applied Physics · 1997 · 476 citations
Near-field differential scanning optical microscope with atomic force regulation
Ricardo Toledo‐Crow, Pan Yang, Y. Chen et al. · Applied Physics Letters · 1992 · 459 citations