Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 39 citations · 11 references
EngineeringBiomedical EngineeringRadiologyDiagnostic ImagingDiagnostic RadiologyRadiation DetectionDetector TechnologyMedical ImagingRadiation Imaging DetectorsRadiographic ImagingX-ray DetectionX-ray DetectorsDetective Quantum EfficiencyDetectorsImaging DetectorsMedical X-ray DetectionNoise Sources In DetectorsNyquist FrequencyQuantum EfficiencyX-ray Detector Arrays
Photoconductive polycrystalline mercuric iodide deposited on flat panel thin film transistor (TFT) arrays is being developed for direct digital X-ray detectors that can perform both radiographic and fluoroscopic medical imaging. The mercuric iodide is either vacuum deposited by Physical Vapor Deposition (PVD) or coated onto the array by a wet Particle-In-Binder (PIB) process. The PVD deposition technology has been scaled up to the 20 cm x 25 cm size required in common medical imaging applications. A TFT array with a pixel pitch of 127 microns is used for these imagers. Arrays of 10 cm x 10 cm size have been used to evaluate performance of mercuric iodide imagers. Radiographic and fluoroscopic images of diagnostic quality at up to 15 pulses per second were demonstrated. As we previously reported, the resolution is limited to the TFT array Nyquist frequency of ~3.9 lp/mm (127 micron pixel pitch). Detective Quantum Efficiency (DQE) has been measured as a function of spatial frequency for these imagers. The DQE is lower than the theoretically calculated value due to some additional noise sources of the electronics and the array. We will retest the DQE after eliminating these noise sources. Reliability and stress testing was also began for polycrystalline mercuric iodide PVD and PIB detectors. These are simplified detectors based upon a stripe electrode or circular electrode structure. The detectors were stressed under various voltage bias, temperature and time conditions. The effects of the stress tests on the detector dark current and sensitivity were determined.
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Thick films of X-ray polycrystalline mercuric iodide detectors
M. Schieber, H. Hermon, Asaf Zuck et al. · Journal of Crystal Growth · 2001 · 89 citations
Natural Sciences, Materials Engineering, Materials Science +11
R. A. Street, Marcelo Mulato, M. Schieber et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 31 citations