Comparative study of Pbl 2 and Hgl 2 as direct detector materials for high-resolution x-ray image sensors

R. A. Street, Marcelo Mulato, M. Schieber, H. Hermon, Kanai S. Shah, Paul R. Bennett, Yuri Dmitryev, Jackson Ho, R. Lau, E. E. Meerson,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 31 citations · 4 references

Concepts

Abstract

X-ray imaging properties are reported for HgI<SUB>2</SUB> and PbI<SUB>2</SUB>, as candidate materials for future direct detection x- ray image sensors, including the first results from screen- printed HgI<SUB>2</SUB> arrays. The leakage current of PbI<SUB>2</SUB> is reduced by using new deposition conditions, but is still larger than HgI<SUB>2</SUB>. Both HgI<SUB>2</SUB> and PbI<SUB>2</SUB> have high spatial resolution but new data shows that the residual image spreading of PbI<SUB>2</SUB> is not due to k-edge fluorescence and its possible origin is discussed. HgI<SUB>2</SUB> has substantially higher sensitivity than PbI<SUB>2</SUB> at comparable bias voltages, and we discuss the various loss mechanisms. Unlike PbI<SUB>2</SUB>, HgI<SUB>2</SUB> shows a substantial spatially non-uniform response that is believed to originate from the large grain size, which is comparable to the pixel size. We obtain zero spatial frequency DQE values of 0.7 - 0.8 with PbI(subscript 24/ under low energy exposure conditions. A model for signal generation in terms of the semiconducting properties of the materials is presented.

References

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