<title>Double Michelson Interferometer For Contactless Thermal Expansion Measurements</title>

E. G. Wolff, S. A. Eselun

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1979 · 12 citations · 0 references

Concepts

Abstract

Laser interferometry provides adequate range and resolution for thermal expansion measurements. However, accuracy can be achieved only if the relative motions of the sample and the optics are known and/ or accounted for. The system described incorporates self compensating features into the optics. Signal processing techniques for real time length change recording are also discussed.