Applied Physics Letters · 1987 · 230 citations · 5 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSolid State PhysicsThin FilmsMagnetic OxidesSuperconducting MaterialsSuperconducting Thin FilmsThin Film Electrical PropertiesThin-film MaterialsRutherford Backscattering SpectrometryRutherford ScatteringSuperconducting PropertiesThickness DependenceThin Oxide FilmsThin Oxide LayersThin-film SuperconductorsX-ray Diffraction Analysis
Thin films of Y-Ba-Cu-O superconductors on (100) SrTiO3 were prepared using the pulsed excimer laser evaporation technique. After an annealing treatment in oxygen the films exhibited superconductivity with zero resistance at 85 K with transition widths (90%–10%) as narrow as a 2 K. A considerable amount of orientation of the films with respect to the substrates was observed by x-ray diffraction and ion channeling techniques. Interface reaction revealed by Rutherford backscattering and Auger electron spectrometry resulted in a thickness dependence of the superconducting properties of the films.
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Thin superconducting oxide films
R. B. Laibowitz, R. H. Koch, P. Chaudhari et al. · Physical review. B, Condensed matter · 1987 · 286 citations