Journal of Applied Physics · 1987 · 57 citations · 9 references
Optical MaterialsPoint DefectsEngineeringMicroscopyCurrent ImagesSemiconductor DeviceBeam OpticSemiconductorsMicroscopy MethodOptical PropertiesComputational ImagingLight MicroscopyCompound SemiconductorPhotonicsImage FormationPhysicsMedical ImagingDefect FormationComputational Optical ImagingOptoelectronicsMicroscope Image ProcessingApplied PhysicsBiomedical ImagingQuantitative Phase ImagingCurrent ModeOptical Beam
We present a model of image formation in scanning optical microscopes operating in the optical beam induced current mode. A perturbation analysis is used, a point spread function is introduced, and specific images of point defects obtained. It is found that the resolution is not limited by the diffusion length.
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Methods of Theoretical Physics
Philip Μ. Morse, Herman Feshbach, E. L. Hill · American Journal of Physics · 1954 · 13.2K citations
Theoretical Physics, Classical System, Theoretical Analysis +1
D. K. Lynch · Journal of the Optical Society of America A · 1987 · 761 citations
Quantitative Scanning Electron Microscopy
Timothy K. Maugel, D. B. Holt, M. D. Muir et al. · Transactions of the American Microscopical Society · 1976 · 290 citations