Reconstruction of true surface‐topographies in scanning electron microscopes using backscattered electrons

Multi-level adaptive solutions to boundary-value problems

Achi Brandt · Mathematics of Computation · 1977 · 3.2K citations

Scanning electron microscopy - 1979

Micron (1969) · 1979 · 705 citations

Electron Microscopy, Physics, Microscopy +3

Scanning Electron Microscopy/1973

John O. Corliss, O. Johari, I. Corvin · Transactions of the American Microscopical Society · 1974 · 305 citations

Electron Microscopy, Microscopy, Scanning Probe Microscopy +3

An automatic topographical surface reconstruction in the SEM

J. Lebiedzik · Scanning · 1979 · 52 citations

Geometric Modeling, Cartography, Surveying +8

Testing of detector strategies in scanning electron microscopy by isodensities

Matthias Lange, L. Reimer, C. Tollkamp · Journal of Microscopy · 1984 · 26 citations

Engineering, Microscopy, Measurement +25