Concepedia

C. Tollkamp

CT

3

Publications

193

Citations

3

H-Index

1980

Active since

Affiliations

University of Münster(Current)

C. Tollkamp is an author at University of Münster specializing in engineering, microscopy, and instrumentation.

Top concepts

Publications per year

1980–1984

3

Publications

3

Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope

L. Reimer, C. Tollkamp · Scanning · 1980 · 152 citations

, , +9

Testing of detector strategies in scanning electron microscopy by isodensities

Matthias Lange, L. Reimer, C. Tollkamp · Journal of Microscopy · 1984 · 26 citations

, , +25

Detector strategy for improvement of image contrast analogous to light illumination

L. Reimer, Marianne Riepenhausen, C. Tollkamp · Scanning · 1984 · 15 citations

, , +11

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