Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes - Concepedia

Concepedia

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Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes

39

Citations

30

References

2010

Year

Zhen Wang, Mark G. Karpovsky, Konrad J. Kulikowski

Journal of Electronic Testing

Hardware SecurityElectrical EngineeringNonlinear Sec-ded CodesEngineeringConcurrent Error DetectionError Control TechniqueError Correction CodeComputer EngineeringComputer ArchitectureSemiconductor MemorySignal ProcessingMemory Architecture

References

	Year	Citations

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