Resolution limit due to thermal effects in low-temperature scanning electron microscopy

Application of low-temperature scanning electron microscopy to superconductors

John R. Clem, R. P. Huebener · Journal of Applied Physics · 1980 · 80 citations · Full text

Natural Sciences, Materials Science, Physics +15

Liquid helium cooled sample stage for scanning electron microscope

H. Seifert · Cryogenics · 1982 · 40 citations

Natural Sciences, Materials Science, Physics +12

Deflection beam-chopping in the SEM

A. Gopinath, M. S. Hill · Journal of Physics E Scientific Instruments · 1977 · 30 citations · Full text

Medicine, Physics, Contact Lens Practice +9

Two-dimensional imaging of hotspots in superconducting bridges by low-temperature scanning electron microscopy

R. Eichele, L. Freytag, H. Seifert et al. · Journal of Low Temperature Physics · 1983 · 27 citations

Natural Sciences, Materials Science, Physics +11

Two-dimensional imaging of the current-density distribution in superconducting tunnel junctions

Peter W. Epperlein, H. Seifert, R. P. Huebener · Physics Letters A · 1982 · 26 citations

Natural Sciences, Electrical Engineering, Physics +16