IEEE Journal of Quantum Electronics · 2009 · 73 citations · 19 references
EngineeringMaterials EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesDetector TechnologyInfrared DetectorsPhotodetectorsSemiconductor DetectorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsDetector Quantum EfficiencyFocal Plane ArraysFocal Plane DetectorsInfrared ArraysInfrared Detector ArraysInfrared PhotodetectorsPhotodiodesQuantum Efficiency
The recent introduction of a M-structure design improved both the dark current and R <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0</sub> A performances of type-II InAs-GaSb photodiodes. A focal plane array fabricated with this design was characterized at 81 K. The dark current of individual pixels was measured between 1.1 and 1.6 nA, 7 times lower than previous superlattice FPAs. This led to a higher dynamic range and longer integration times. The quantum efficiency of detectors without antireflective coating was 74%. The noise equivalent temperature difference reached 23 mK, limited only by the performance of the testing system and the read out integrated circuit. Background limited performances were demonstrated at 81 K for a 300 K background.
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A new semiconductor superlattice
G.A. Sai-Halasz, Raphael Tsu, L. Esaki · Applied Physics Letters · 1977 · 564 citations