Concepedia

Publication | Closed Access

Reliability of built in aluminum interconnection with low-ε dielectric based on porous anodic alumina

DOI

26

Citations

4

References

2000

Year

S. K. Lazarouk, S Katsouba, A Demianovich, V Stanovski, S Voitech, V. B. Vysotski, V. N. Ponomar’
Solid-State Electronics

References

YearCitations

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