The reciprocity of electron diffraction and electron channeling

Abstract

Abstract The reciprocity in electron diffraction is demonstrated in thin and thick crystals by using an electron microscope with scanning system. It is concluded that the experiment of electron channeling is identical with that of Kikuchi patterns. The diffraction patterns from thin and thick films of silicon, copper and gold are observed with a 1 MV electron microscope and the relations between the channeling and diffraction are studied along various crystal axes. The diffraction can be classified into flower and geometrical patterns. The former is observed for gold and for the <110> axes in silicon and copper. In this case, the classical theory may be applicable, and the ratios between Lindhard's critical angle and the observed one are about 0.65. The relation between channeling and various well known phenomena in electron diffraction is discussed.