Measurement of interface states parameters of Si1−x−yGexCy/TiW Schottky contacts using Schottky capacitance spectroscopy - Concepedia

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Measurement of interface states parameters of Si1−x−yGexCy/TiW Schottky contacts using Schottky capacitance spectroscopy

15

Citations

6

References

1999

Year

M. Zamora, G.K. Reeves, G. Gazecki, Jing Mi, Changduk Yang

Solid-State Electronics

Electrical EngineeringSi1−x−ygexcy/tiw Schottky ContactsEngineeringPhysicsSurface ScienceApplied PhysicsSemiconductor MaterialSchottky Capacitance SpectroscopyCharge Carrier TransportInterface States ParametersInterface Property

References

	Year	Citations

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