Abrupt suppression of the exchange bias across a non-magnetic insulator spacer

Abstract

This paper reports results obtained on exchange-biased IrMn/Al2O3/Co films deposited by magnetron sputtering, where the thickness of the non-magnetic insulator layer, tAl2O3, was varied. Ferromagnetic resonance and static magnetization measurements were used to study the exchange interaction between the antiferromagnet (IrMn) and ferromagnet (Co) layers. X-ray diffractometry and x-ray reflectometry as well as high-resolution transmission electron microscopy were employed for structural characterization of the films. It was found that the IrMn/Co exchange coupling decreases very abruptly with tAl2O3 being the exponential decay length at least four times smaller than the values previously reported for exchange-bias systems. Such a rapid suppression of the coupling is explained in terms of the prompt loss of the direct contact between the antiferromagnet and the ferromagnet with tAl2O3.