Publication | Closed Access
Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate
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Citations
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References
1996
Year
EngineeringSoft MatterNanotribologyMicron-size Polystyrene SphereMechanicsContact MechanicNanoscale ModelingInteraction Force GradientMicrometer-size SphereMaterials SciencePhysicsNanotechnologySurface EnergySurface TensionFlat SubstratePhysical ChemistrySurface CharacterizationElectronic MaterialsMicrofabricationInterfacial PhenomenonSurface Charge DensitySurface ScienceApplied PhysicsScanning Force MicroscopyInterfacial PhenomenaInterfacial Study
The interaction force gradient between a micron-size polystyrene sphere and an atomically flat highly oriented pyrolytic graphite substrate has been analyzed as a function of surface-to-surface separation distance ${\mathit{z}}_{0}$ using an oscillating cantilever technique. The interaction force gradient was found to have two contributions. For ${\mathit{z}}_{0}$\ensuremath{\ge}30 nm, an electrostatic force due to charges trapped on the polystyrene sphere dominates. For ${\mathit{z}}_{0}$\ensuremath{\le}30 nm, a van der Waals interaction, characteristic of a sphere near a flat plane, is observed. Fits to the data are in good agreement with theoretical expectations and allow estimates of the surface charge density triboelectrically produced on the sphere's surface. \textcopyright{} 1996 The American Physical Society.
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