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The measurement of single-crystal lattice parameters using a double-diffraction technique
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1973
Year
X-ray CrystallographyCrystal StructureOptical MaterialsEngineeringElectron DiffractionOptical PropertiesDouble-diffraction TechniqueTriple DiffractionLattice ParametersCrystal FormationMaterials ScienceModified Double-diffraction TechniquePhysicsGallium OxideCrystallographyCrystal Structure DesignNatural SciencesX-ray DiffractionCondensed Matter PhysicsApplied Physics
A modified double-diffraction technique is described for the accurate measurement of lattice parameters of (100) slices of gallium arsenide. The method relies on the selection of appropriate reflexions for producing a pseudo-point of triple diffraction, and the determination of the wavelength necessary to produce such a triple point. Results are presented which show that lattice parameters can be determined rapidly and simply to better than 1 in 105.