Spin-dependent scattering in a silicon transistor

Abstract

The scattering of conduction electrons off neutral donors depends sensitively on the relative orientation of their spin states. We present a theory of spin-dependent scattering in the two-dimensional electron gas (2DEG) of field effect transistors. Our theory shows that the scattering mechanism is dominated by virtual transitions to negatively ionized donor levels. This effect translates into a source-drain current that always gets reduced when donor spins are at resonance with a strong microwave field. We propose a model for donor impurities interacting with conduction electrons in a silicon transistor, and compare our explicit numerical calculations to electrically detected magnetic-resonance (EDMR) experiments. Remarkably, we show that EDMR is optimal for donors placed into a sweet spot located at a narrow depth window quite far from the 2DEG interface. This allows significant optimization of spin signal intensity for the minimal number of donors placed into the sweet spot, enabling the development of single spin readout devices. Our theory reveals an interesting dependence on conduction electron-spin polarization ${p}_{c}$. As ${p}_{c}$ increases upon spin injection, the EDMR amplitude first increases as ${p}_{c}^{2}$ and then saturates when a polarization threshold ${p}_{T}$ is reached. These results show that it is possible to use EDMR as an in situ probe of carrier spin polarization in silicon and other materials with weak spin-orbit coupling.