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Use of quartz vibration for weighing thin films on a microbalance

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Elastic, piezoelectric and dielectric properties of ZnO and CdS single crystals in a wide range of temperatures

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Thermal expansion coefficient of polycrystalline silicon and silicon dioxide thin films at high temperatures

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Preferred orientation and piezoelectricity in sputtered ZnO films

Z. M. Rittersma, G.J. Burger · Journal of Applied Physics · 1998 · 203 citations

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