Metrology for information technology

Abstract

article Free Access Share on Metrology for information technology Authors: Lisa Carnahan National Institute of Standards and Technology, Gaithersburg, MD National Institute of Standards and Technology, Gaithersburg, MDView Profile , Gary Carver National Institute of Standards and Technology, Gaithersburg, MD National Institute of Standards and Technology, Gaithersburg, MDView Profile , Martha Gray National Institute of Standards and Technology, Gaithersburg, MD National Institute of Standards and Technology, Gaithersburg, MDView Profile , Michael Hogan National Institute of Standards and Technology, Gaithersburg, MD National Institute of Standards and Technology, Gaithersburg, MDView Profile , Theodore Hopp National Institute of Standards and Technology, Gaithersburg, MD National Institute of Standards and Technology, Gaithersburg, MDView Profile , Jeffrey Horlick National Institute of Standards and Technology, Gaithersburg, MD National Institute of Standards and Technology, Gaithersburg, MDView Profile , Gordon Lyon National Institute of Standards and Technology, Gaithersburg, MD National Institute of Standards and Technology, Gaithersburg, MDView Profile , Elena Messina National Institute of Standards and Technology, Gaithersburg, MD National Institute of Standards and Technology, Gaithersburg, MDView Profile Authors Info & Claims StandardViewVolume 5Issue 3Sept. 1997 pp 103–109https://doi.org/10.1145/266231.266236Published:01 September 1997Publication History 2citation478DownloadsMetricsTotal Citations2Total Downloads478Last 12 Months17Last 6 weeks5 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my Alerts New Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF