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Degradation modes in planar structure in<sub>0.53</sub>Ga<sub>0.47</sub>As photodetectors
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1983
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Wide-bandgap SemiconductorEngineeringPhysicsOphthalmologyOptical PropertiesApplied PhysicsForced Degradation TestsNonrecoverable Degradation ModesComputational ImagingOptoelectronic DevicesPhotoelectric MeasurementDegradation ModesPhotodegradationOptoelectronicsCompound SemiconductorImage SensorRadiologyHeterojunction Photodetectors
Recoverable and nonrecoverable degradation modes have been found by forced degradation tests in In <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.53</inf> Ga <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.47</inf> As heterojunction photodetectors. In <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.76</inf> Ga <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.24</inf> As <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.55</inf> P <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.45</inf> cap layer and In <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.53</inf> Ga <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.47</inf> As light-absorption layer were grown by liquid-phase epitaxy (LPE) on a
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