Publication | Closed Access
Static secondary ion mass spectrometry (S-SIMS) Part 2: material science applications
82
Citations
145
References
1999
Year
Materials ScienceMaterial Science ApplicationsEngineeringAnalytical InstrumentationNatural SciencesSpectroscopyMass SpectrometryAnalytical ChemistryIon Mobility SpectrometryChemistryInstrumentationElemental CharacterizationChromatographyIon Mobility
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