Structural Information, Resolution, and Noise in High-Resolution Atomic Force Microscopy Topographs - Concepedia

Concepedia

Publication | Open Access

Structural Information, Resolution, and Noise in High-Resolution Atomic Force Microscopy Topographs

DOI Full Paper Access

59

Citations

38

References

2009

Year

Peter Fechner, Thomas Boudier, Stéphanie Mangenot, Szymon Jarosławski, James N. Sturgis, Simon Scheuring

Biophysical Journal

Structural InformationEngineeringElectron MicroscopyPhysicsMicroscopyMicroscopy MethodScanning Probe MicroscopyApplied PhysicsScanning Force MicroscopyAtomic PhysicsMedicineCrystallographyBiophysics

References

	Year	Citations

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