Monte Carlo simulation of background in AES: a comparison with experiment

Calculations of electron inelastic mean free paths for 31 materials

Shigeo Tanuma, C. J. Powell, David R. Penn · Surface and Interface Analysis · 1988 · 937 citations

Natural Sciences, Materials Science, Physics +13

Electron mean-free-path calculations using a model dielectric function

David R. Penn · Physical review. B, Condensed matter · 1987 · 795 citations

Natural Sciences, Materials Science, Physics +12

Electron excitation and the optical potential in electron microscopy

R. H. Ritchie, A. Howie · Philosophical magazine · 1977 · 427 citations

Natural Sciences, Physics, Condensed Matter Physics +14

Inelastic collisions of kV electrons in solids

Zejun Ding, Ryōsuke Shimizu · Surface Science · 1989 · 147 citations

Natural Sciences, Physics, Condensed Matter Physics +13

Quantitative AES and XPS: Determination of the electron spectrometer transmission function and the detector sensitivity energy dependencies for the production of true electron emission spectra in AES and XPS

M. P. Seah, Graham C. Smith · Surface and Interface Analysis · 1990 · 101 citations

Natural Sciences, Chemistry, Analytical Chemistry +16