Publication | Closed Access
Ab initio modeling of structure and defects at the HfO2/Si interface
56
Citations
8
References
2005
Year
EngineeringPhysicsHfo2/si InterfaceBias Temperature InstabilityApplied PhysicsCondensed Matter PhysicsDefect FormationSemiconductor Device FabricationSilicon On InsulatorAb Initio ModelingSemiconductor Device
| Year | Citations | |
|---|---|---|
Page 1
Page 1