Focused ion beam and scanning electron microscopy for 3D materials characterization - Concepedia

Concepedia

Publication | Open Access

Focused ion beam and scanning electron microscopy for 3D materials characterization

DOI Full Paper Access

39

Citations

24

References

2014

Year

Paul G. Kotula, Gregory S. Rohrer, Michael P. Marsh

Materials ScienceEngineeringElectron MicroscopyMicroscopyScanning Probe MicroscopyMaterials CharacterizationApplied PhysicsElectron MicroscopeIon Beam

References

	Year	Citations

Page 1