Specified value based defect depth prediction using pulsed thermography

Abstract

Several methods have been reported in the literature using pulsed thermography for quantitative measurement of defect depth or sample thickness. In this paper, based on the analysis of a theoretical one-dimensional solution of pulsed thermography, a new method was proposed to first multiply the original temperature decay with square root of the corresponding time to obtain a monotonically increasing function f. A specific time was obtained by setting f equals to a predefined value, the theoretical model shows that the obtained specific time has linear relation with square of defect depth, which was verified with the experimental results of one aluminum and one glass fiber reinforced polymer specimen machined with six flat-bottom wedges as simulated defects. This linearity can be used for defect depth prediction in pulsed thermography.