Wafer level reliability and leakage current modeling of PZT capacitors - Concepedia

Concepedia

Publication | Closed Access

Wafer level reliability and leakage current modeling of PZT capacitors

39

Citations

8

References

2005

Year

E. Bouyssou, R. Jérisian, N. Cézac, P. Leduc, Guillaume Guégan, Christine Anceau

Materials Science and Engineering B

Device ModelingElectrical EngineeringReliability EngineeringEngineeringWafer Level ReliabilityHardware ReliabilityCircuit ReliabilityDevice ReliabilityMicroelectronicsPhysic Of Failure

References

	Year	Citations

Page 1