Concepedia

Wafer level reliability and leakage current modeling of PZT capacitors

E. Bouyssou, R. Jérisian, N. Cézac, P. Leduc, Guillaume Guégan, Christine Anceau

Materials Science and Engineering B · 2005 · 40 citations · 8 references

DOI

Concepts

References

8

dc Electrical Degradation of Perovskite‐Type Titanates: I, Ceramics

Rainer Waser, Tudor Baiatu, Karl‐Heinz Härdtl · Journal of the American Ceramic Society · 1990 · 677 citations

, , +16

Current-voltage characteristics of ultrafine-grained ferroelectric Pb(Zr, Ti)O<sub>3</sub> thin films

H. Hu, S. B. Krupanidhi · Journal of materials research/Pratt's guide to venture capital sources · 1994 · 153 citations

, , +14

Electrical conductivity in ferroelectric thin films

Dirk J. Wouters, Geert J. Willems, H.E. Maes · Microelectronic Engineering · 1995 · 59 citations

, , +14

Dielectric breakdown in high-ε films for ULSI DRAMs

J. F. Scott, B. M. Melnick, L. D. McMillan et al. · Integrated ferroelectrics · 1993 · 48 citations

, , +17

Electrical transport and dielectric breakdown in Pb(Zr,Ti)O<sub>3</sub>thin films

X. Chen, Angus I. Kingon, H. Al-Shreef et al. · Ferroelectrics · 1994 · 43 citations

, , +17