Thin carbon films: II. Structure and properties

Abstract

The growth of thin carbon films of various modifications is studied. The films are applied by ion-beam sputtering of graphite, and the resulting carbon condensate is exposed to either ion or electron beams at low temperature and pressures. The phase composition, structure, surface morphology, and emissivity of the carbon films are examined by X-ray diffraction, Raman spectroscopy, and atomic-force microscopy.