Fracional–Fringe Holographic Plasma Interferometry

Abstract

Holographic interferometry can be applied to plasmas whose density results in shifts of less than one fringe by superposing the small shifts on an arbitrarily shaped and positioned background fringe pattern. The sensitivity of holographic interferometry is thereby increased to that of conventional interferometry, while the inherent advantages of holography are retained. The background fringes also simplify detection of the spurious phase changes that can arise in holography from motions of the apparatus.