Applied Physics Letters · 2006 · 12 citations · 20 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsNanotechnologySemiconductor DevicesCarbon NanotubesCarrier TransportField-effect TransistorsNanoelectronicsNanotubesSemiconductor PhysicsCarbon Nanotube ElectronicsCarbon Nanotube Field-effect TransistorsCarbon Nanotube NetworksDoping In NanostructuresNanotube DopingSchottky Barrier CharacteristicsSchottky Barrier ContactsSchottky Barriers
We investigated a role of a Schottky barrier (SB) in carrier doped random-network single-walled carbon nanotube field effect transistors (RN-SWNT-FETs) and the precise estimation of the SB height by a suitable combination of the gate and source-drain voltages. The SB heights were 70meV for hole and 100meV for electron in p- and n-type FETs, respectively. Furthermore, the barrier height was able to be modulated by changing the doping level, which indicates the possibility of controlling the characteristics of RN-SWNT-FETs.
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Single-shell carbon nanotubes of 1-nm diameter
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