Thickness dependent physical properties of close space evaporated In2S3 films

Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · Journal of Physics E Scientific Instruments · 1983 · 3.9K citations

Natural Sciences, Materials Engineering, Materials Science +17

The electrical properties of polycrystalline silicon films

John Y. W. Seto · Journal of Applied Physics · 1975 · 2.9K citations

Engineering, Electrical Engineering, Materials Science +17

Thin Film Phenomena

K. L. Chopra, Julius Klerrer · Journal of The Electrochemical Society · 1970 · 2K citations

Toward a Unified Theory of Urbach's Rule and Exponential Absorption Edges

John D. Dow, David Redfield · Physical review. B, Solid state · 1972 · 739 citations

Natural Sciences, Materials Science, Physics +12

Influence of postdeposition annealing on the structural and optical properties of sputtered zinc oxide film

Vinay Gupta, Abhai Mansingh · Journal of Applied Physics · 1996 · 624 citations

Natural Sciences, Materials Science, Physics +17